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LABORATORY
For the constantly changing demands in X-ray diffraction analysis and experiments, CAMET maintains customized goniometers of various make with a wide selection of attachments. All diffractometers and spectrometers as well as data acquisition are computer controlled. On 8 sealed tube stands and a RIGAKU RU-200 Rotating Anode unit the laboratory actively employs
- 6 Vertical NORELCO Wide Angle Diffractometers for powder diffraction
- HUBER Guinier Thin Film Diffractometer for phase analysis and line profile study of thin films
- Incident Parallel Beam Diffractometer for textured thin films (Rocking Curve)
- Parallel Beam Diffractometer for thin film characterization
- Schulz Texture Diffractometer for polycrystalline thin films
- High Precision Single Crystal Orienter for large non-uniform crystals and large diameter wafers
- Double Crystal Diffractometer with 4-Channel cut Ge- Monochromator
- ACT Topography Set-Up, probing a specimen area of up to 1cm x 4cm in reflection
- Cameras for microanalysis (Debye-Scherrer, Gandolfi, Guinier, Pin Hole)
- Camera and attachment for stress analysis (Flat Plate)
- Camera and attachments for crystal orientation and fiber analysis
- Wavelength dispersive XRF vacuum spectrometer (SIEMENS)
CAMET Research, Inc. - 6409 Camino Vista #F, Goleta, California 93117 - Tel. (805) 685-1665 - Fax (805) 685-9082 - E-mail: camet@camet-lab.com