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CAMET strives that all studies and technical work carried out do conform to Good Laboratory Practices. An extensive Quality Assurance Program is in place. Many laboratory services provided by CAMET will satisfy the requirements which are set forth by regulatory agencies such as FDA, NRC and OSHA, follow standard procedures like those of ASTM and SAE or employ certain test specifications which are adopted or developed by the client himself. CAMET is an approved vendor for all major semiconductor manufacturers. The LOTUS Notes/DominoTM for Windows NTTM platform is chosen for electronic record keeping and data management.
Phase Analysis
- Inorganic and organic polycrystalline materials
- Diffractometer and film methods
- Internal, external and standardless quantitative techniques
- Microanalysis (microgram sample size)
- Crystalline/amorphous phase ratios
- Peak search and fitting software
Most quantitative analyses on phase mixtures are carried out by the Rietveld method. This technique is a least squares algorithm which is now widely accepted. It is standardless and solely based on the crystal structure of the constituents.
Residual Stress Analysis
Determination of uniform strain using X-ray powder diffraction techniques (counter and film); performed on thin films, coatings and complex solid metal structures such as wireforms, welds etc..Line Broadening Analysis
Line broadening effects produced by non uniform micro-strain and small crystallite size (<1500 Angstrom); analyzed by the Warren-Averbach technique (=Fourier analysis of diffraction profiles).Thin Film Analysis
Glancing angle thin film diffractometry for phase identification and line broadening analysis; incident parallel beam diffractometry for texture of highly oriented, polycrystalline films (rocking curve).Single Crystal Diffractometry
Methods include Laue transmission and back reflection techniques; double crystal diffractometry (rocking curve), double crystal topography (ACT).Special Applications in Diffraction
Diffraction measurements at high temperature and in non-ambient atmosphere; high precision crystal orientation and orientation of very large single crystals (film and counter); fiber texture.Wavelength Disperse XRF-Analysis
Vacuum XRF spectrometer with flow proportional detector and an RAP analyzing crystal for lighter elements of Na(11) and above; scintillation counter in combination with highly reflective LiF analyzing crystal for elements of Ti(22) and above; designed for nonstandard, customized experiments and analytes in unusual matrix; alternative calibration approaches, i.e. multiple standard addition; scattered X-Ray background-ratio method for nondestructive as-is analysis of objects with rough or uneven surface.
Quantification of Retained Austenite
Determination of Respirable Crystalline Silica
Determination of the Ca/P Molar Ratio in Calcium Hydroxyapatite
CAMET Research, Inc. - 6409 Camino Vista #F, Goleta, California 93117 - Tel. (805) 685-1665 - Fax (805) 685-9082 - E-mail: camet@camet-lab.com